Fast‑camera imaging shows a stable, annular plasma column with < 5 % intensity fluctuations over 10 s observation windows. The measured standard deviation of heat flux across the 100 mm target diameter is , meeting the uniformity criteria for most thin‑film deposition processes.
Fast‑camera imaging shows a stable, annular plasma column with < 5 % intensity fluctuations over 10 s observation windows. The measured standard deviation of heat flux across the 100 mm target diameter is , meeting the uniformity criteria for most thin‑film deposition processes.